Observation of Unusual Homoepitaxy in Ultrathin Pentacene Films and Correlation with Surface Electrostatic Potential

被引：34

作者：

Kalihari, Vivek ^{[1
]}

Ellison, David J. ^{[1
]}

Haugstad, Greg ^{[2
]}

Frisbie, C. Daniel ^{[1
]}

机构：

[1] Univ Minnesota, Dept Chem Engn & Mat Sci, Minneapolis, MN 55455 USA

[2] Univ Minnesota, Characterizat Facil, Shepherd Labs, Minneapolis, MN 55455 USA

来源：

ADVANCED MATERIALS | 2009年 / 21卷 / 30期

基金：

美国国家科学基金会;

关键词：

FIELD-EFFECT TRANSISTORS; PROBE FORCE MICROSCOPY; ORGANIC TRANSISTORS; ELECTRICAL CHARACTERISTICS; POLYCRYSTALLINE PENTACENE; MOLECULAR-WEIGHT; HIGH-PERFORMANCE; WORK FUNCTION; THIN-FILMS; MOBILITY;

D O I：

10.1002/adma.200900362

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Pentacene second layer grows with a twist (similar to 76 degrees) on the first layer, while the third and subsequent layers show commensurism with their respective underlayers. The preferred twisting of the second layer on the first layer gives rise to epitaxial and non-epitaxial domains which also reflect in the surface electrostatic potential measurements.

引用

页码：3092 / +

页数：8

共 62 条

[1] Kinetics-driven anisotropic growth of pentacene thin films [J].

Al-Mahboob, Abdullah ;

Sadowski, Jerzy T. ;

Fujikawa, Yasunori ;

Nakajima, Kazuo ;

Sakurai, Toshio .

PHYSICAL REVIEW B, 2008, 77 (03)

[2] ATOMIC FORCE MICROSCOPE [J].

BINNIG, G ;

QUATE, CF ;

GERBER, C .

PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933

[3] Effects of grain boundaries, field-dependent mobility, and interface trap states on the electrical characteristics of pentacene TFT [J].

Bolognesi, A ;

Berliocchi, M ;

Manenti, M ;

Di Carlo, A ;

Lugli, P ;

Lmimouni, K ;

Dufour, C .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 2004, 51 (12) :1997-2003

[4] Scratching the surface: Fundamental investigations of tribology with atomic force microscopy [J].

Carpick, RW ;

Salmeron, M .

CHEMICAL REVIEWS, 1997, 97 (04) :1163-1194

[5] Field-effect transistors based on self-organized molecular nanostripes [J].

Cavallini, M ;

Stoliar, P ;

Moulin, JF ;

Surin, M ;

Leclère, P ;

Lazzaroni, R ;

Breiby, DW ;

Andreasen, JW ;

Nielsen, MM ;

Sonar, P ;

Grimsdale, AC ;

Mullen, K ;

Biscarini, F .

NANO LETTERS, 2005, 5 (12) :2422-2425

[6] Electrostatic field and partial Fermi level pinning at the pentacene-SiO2 interface [J].

Chen, LW ;

Ludeke, R ;

Cui, XD ;

Schrott, AG ;

Kagan, CR ;

Brus, LE .

JOURNAL OF PHYSICAL CHEMISTRY B, 2005, 109 (05) :1834-1838

[7] Photoinduced interfacial charging and "explosion" of monolayer pentacene islands [J].

Chen, LW ;

Cherniavskaya, O ;

Shalek, A ;

Brus, LE .

NANO LETTERS, 2005, 5 (11) :2241-2245

[8] Observation of field-effect transistor behavior at self-organized interfaces [J].

Chua, LL ;

Ho, PKH ;

Sirringhaus, H ;

Friend, RH .

ADVANCED MATERIALS, 2004, 16 (18) :1609-+

[9]

Dimitrakopoulos CD, 2002, ADV MATER, V14, P99, DOI 10.1002/1521-4095(20020116)14:2<99::AID-ADMA99>3.0.CO

[10]

2-9

← 1 2 3 4 5 6 7 →