Nanometer scale patterning by scanning tunelling microscope assisted chemical vapour deposition

被引:10
作者
Marchi, F
Tonneau, D
Dallaporta, H
Pierrisnard, R
Bouchiat, V
Safarov, VI
Doppelt, P
Even, R
机构
[1] Fac Sci Luminy, Dept Phys, F-13288 Marseille, France
[2] Ecole Super Phys & Chim Ind, F-75231 Paris, France
关键词
lithography; single electron device; chemical vapour deposition; scanning tunneling microscope; metallization;
D O I
10.1016/S0167-9317(99)00265-8
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Single electron devices are of great interest for their possible replacement of transistors in memories. The key to the preparation of these components is the production of low capacitance dots, which requires a lithography step at nanometric scale. Direct patterning of metallic features at nanometric scale is possible by local decomposition of gaseous molecules under a scanning tunneling microscope (STM) tip, by application of a voltage of a few volts on the sample (STM assisted chemical vapour deposition). The gaseous molecules are dissociated by the high electric field (about 10(7) V/cm) within the tip-sample gap. Rhodium lines and dots have been deposited on gold or silicon surfaces by decomposition of [Rh(PF3)(2)Cl](2). The influence of the sample voltage was studied and the resolution limit of the technique was investigated. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:59 / 65
页数:7
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