Field-emission cold-cathode El source for a microscale ion trap mass spectrometer

被引：32

作者：

Kornienko, O ^{[1
]}

Reilly, PTA ^{[1
]}

Whitten, WB ^{[1
]}

Ramsey, JM ^{[1
]}

机构：

[1] Oak Ridge Natl Lab, Oak Ridge, TN 37831 USA

来源：

ANALYTICAL CHEMISTRY | 2000年 / 72卷 / 03期

关键词：

D O I：

10.1021/ac990962s

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

A cold-cathode electron impact ionization source based on field emission from an array of diamond-coated silicon whiskers is described. The source is coupled to a micro-scale ion trap mass spectrometer (r(0) = 0.50 mm, z(0) = 0.50 mm). An electron beam of 250 nA could be obtained through the 0.45-mm diameter opening in the end cap electrode.

引用

页码：559 / 562

页数：4

共 16 条

[1]

Amaratunga GAJ, 1996, APPL PHYS LETT, V68, P2529, DOI 10.1063/1.116173

[2] AN ANALYSIS OF FIELD-INDUCED HOT-ELECTRON EMISSION FROM METAL-INSULATOR MICROSTRUCTURES ON BROAD-AREA HIGH-VOLTAGE ELECTRODES [J].