Can interface dislocations degrade ferroelectric properties?

被引:157
作者
Alpay, SP [1 ]
Misirlioglu, IB
Nagarajan, V
Ramesh, R
机构
[1] Univ Connecticut, Dept Met & Mat Engn, Storrs, CT 06269 USA
[2] Univ Connecticut, Inst Mat Sci, Storrs, CT 06269 USA
[3] Forschungszentrum Julich, Dept IFF, Inst Elect Mat, D-52425 Julich, Germany
[4] Univ Calif Berkeley, Dept Mat Sci & Engn, Berkeley, CA 94720 USA
[5] Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA
基金
美国国家科学基金会;
关键词
D O I
10.1063/1.1788894
中图分类号
O59 [应用物理学];
学科分类号
摘要
A thermodynamic analysis has been carried out to investigate the role of dislocations in ferroelectric materials. Due to the coupling of the stress field of the dislocation and the polarization, there is a drastic variation in the polarization near the dislocation. These polarization gradients result in strong depolarizing fields that suppress the polarization in a region that extends over several nanometrers. In epitaxial ferroelectric films, these polarization gradients should result in the formation of dead layers that severely degrade ferroelectric properties. The detrimental effect of such regions will be enhanced in ultrathin ferroelectric thin films, and hence play a critical extrinsic role in size effect studies of ferroelectrics. (C) 2004 American Institute of Physics.
引用
收藏
页码:2044 / 2046
页数:3
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