The measurements of particle/crystallite size in nanostructured TiO2 films by SAXS/WAXD method

被引：7

作者：

Lavcevic, ML

Turkovic, A

机构：

[1] Univ Split, Fac Chem Technol, Dept Phys, Split 21000, Croatia

[2] Rudjer Boskovic Inst, Zagreb 10002, Croatia

来源：

SCRIPTA MATERIALIA | 2002年 / 46卷 / 07期

关键词：

titanium dioxide; film; annealing; small-angle X-ray scattering; wide-angle X-ray diffraction; microstructure;

D O I：

10.1016/S1359-6462(02)00021-0

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Films of nanostructured TiO2 on glass substrates, prepared and annealed by different procedures were examined by small-angle X-ray scattering and wide-angle X-ray diffraction. Insight into their structure is given by analysis of the correlation between the average particle size and the average crystallite size during the thermal evolution of the films. (C) 2002 Acta Materialia Inc. Published by Elsevier Science Ltd, All rights reserved.

引用

页码：501 / 505

页数：5

共 7 条

[1]

Guinier A., 1939, Ann Phys, V12, P161, DOI DOI 10.1051/ANPHYS/193911120161

[2] LIGHT-INDUCED REDOX REACTIONS IN NANOCRYSTALLINE SYSTEMS [J].