Study of lithium fluoride/tris(8-hydroxyquinolino)-aluminum interfacial chemistry using XPS and ToF-SIMS

被引:18
作者
Song, WJ
So, SK
Wong, KW
Choi, WK
Cao, LL
机构
[1] Tsing Hua Univ, Dept Chem, Beijing 100084, Peoples R China
[2] Hong Kong Baptist Univ, Dept Phys, Kowloon, Hong Kong, Peoples R China
[3] Hong Kong Baptist Univ, Ctr Surface Anal & Res, Kowloon, Hong Kong, Peoples R China
[4] Chinese Univ Hong Kong, Dept Chem, Shatin, Hong Kong, Peoples R China
关键词
interfacial reaction; alq(3); organic light-emittng devices;
D O I
10.1016/j.apsusc.2004.01.036
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The insertion of a thin LiF layer between Al and tris(8-hydroxyquinolino)-aluminum (Alq(3)) is a significant advance in the practical development of organic light-emitting devices (OLEDs). We studied the chemistry at the buried interface of LiF/Alq(3) using X-ray photoelectron spectroscopy (XPS) and time of flight secondary ion mass spectrometry (ToF-SIMS). Dramatic changes in Al 2p, N 1s, and O 1s line shapes were observed after LiF deposition. These changes were attributed to the partial substitution of hydroxyquinoline ligands of Alq(3) by F-, and the formation of hydroxyquinoline anions at the LiF/Alq(3) interface. The AlqF(-) structure of products was confirmed by ToF-SIMS. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:373 / 377
页数:5
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