共 16 条
[1]
Blunt L., 2003, ADV TECHNIQUES ASSES
[3]
DIETZSCH M, 2005, P 10 INT C METR PROP, P143
[4]
Huffel S. V., 1991, TOTAL LEAST SQUARES
[5]
International Organization for Standardization, 1997, 42871997 ISO
[6]
*ISO, 2004, 16610 ISO
[7]
*ISO TC 213 WORKGR, 2005, GEOM PROC SPEC GPS 2
[8]
Jahne B., 1999, Handbook of Computer Vision and Applications, V2
[9]
Pattern analysis and metrology: the extraction of stable features from observable measurements
[J].
PROCEEDINGS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES,
2004, 460 (2050)
:2845-2864