Metal-insulator-metal injector for ballistic electron emission spectroscopy

被引：4

作者：

Heer, R ^{[1
]}

Rakoczy, D ^{[1
]}

Ploner, G ^{[1
]}

Strasser, G ^{[1
]}

Gornik, E ^{[1
]}

Smoliner, J ^{[1
]}

机构：

[1] Vienna Univ Technol, Inst Festkorperelektron & Mikrostukturzentrum, A-1040 Vienna, Austria

来源：

APPLIED PHYSICS LETTERS | 1999年 / 75卷 / 25期

关键词：

D O I：

10.1063/1.125520

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We introduce a solid-state version of ballistic electron emission microscopy/spectroscopy (BEEM/BEES) on GaAs-AlGaAs heterostructures using a metal-insulator-metal (MIM) injector structure that replaces the tip of the scanning tunneling microscope (STM). In the present work, the MIM injector is realized by an Al-Al2O3-Al tunnel junction yielding an easy-to-fabricate three-terminal device for ballistic electron spectroscopy. The device principle is applied to several GaAs-AlGaAs structures. The barrier heights obtained from the onsets of the ballistic current spectra are in good agreement with self-consistent calculations as well as earlier experimental results achieved with STM-based BEES. (C) 1999 American Institute of Physics. [S0003-6951(99)02151-8].

引用

页码：4007 / 4009

页数：3

共 19 条

[1] OBSERVATION OF INTERFACE BAND-STRUCTURE BY BALLISTIC-ELECTRON-EMISSION MICROSCOPY [J].

BELL, LD ;

KAISER, WJ .

PHYSICAL REVIEW LETTERS, 1988, 61 (20) :2368-2371

[2]

BERGMANN D, 1997, J VAC SCI TECHNOL B, V15, P2844

[3] TUNNELING HOT-ELECTRON TRANSISTOR AS A HIGH-POWER SOURCE AT TERAHERTZ FREQUENCIES [J].

DELLOW, MW ;

CRONIN, NJ ;

BENDING, SJ .

APPLIED PHYSICS LETTERS, 1994, 65 (19) :2463-2465

[4] Probing of superlattice minibands by ballistic electron emission microscopy [J].

Eder, C ;

Smoliner, J ;

Heer, R ;

Strasser, G ;

Gornik, E .

PHYSICA E, 1998, 2 (1-4) :850-853

[5]

HANSMA P., 1982, TUNNELING SPECTROSCO, V1

[6] Ballistic electron emission microscopy on biased GaAs-AlGaAs superlattices [J].

Heer, R ;

Smoliner, J ;

Strasser, G ;

Gornik, E .

APPLIED PHYSICS LETTERS, 1998, 73 (21) :3138-3140

[7] DIRECT OBSERVATION OF BALLISTIC TRANSPORT IN GAAS [J].

HEIBLUM, M ;

NATHAN, MI ;

THOMAS, DC ;

KNOEDLER, CM .

PHYSICAL REVIEW LETTERS, 1985, 55 (20) :2200-2203

[8] BALLISTIC-ELECTRON-EMISSION MICROSCOPY OF ELECTRON-TRANSPORT THROUGH ALAS/GAAS HETEROSTRUCTURES [J].

KAISER, WJ ;

HECHT, MH ;

BELL, LD ;

GRUNTHANER, FJ ;

LIU, JK ;

DAVIS, LC .

PHYSICAL REVIEW B, 1993, 48 (24) :18324-18327

[9] DIRECT INVESTIGATION OF SUBSURFACE INTERFACE ELECTRONIC-STRUCTURE BY BALLISTIC-ELECTRON-EMISSION MICROSCOPY [J].

KAISER, WJ ;

BELL, LD .

PHYSICAL REVIEW LETTERS, 1988, 60 (14) :1406-1409

[10] BALLISTIC ELECTRON-EMISSION SPECTROSCOPY OF METALS ON GAP(110) [J].

LUDEKE, R ;

PRIETSCH, M ;

SAMSAVAR, A .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (04) :2342-2348

← 1 2 →