Photocatalytic degradation of phenol by TiO2 thin films prepared by sputtering

被引:156
作者
Dumitriu, D
Bally, AR
Ballif, C
Hones, P
Schmid, PE
Sanjinés, R
Lévy, F
Pârvulescu, VI
机构
[1] Univ Bucharest, Fac Chem, Dept Chem Technol & Catalysis, Bucharest 70346, Romania
[2] Inst Nonferrous & Rare Met, Bucharest 73957, Romania
[3] Ecole Polytech Fed Lausanne, Swiss Fed Inst Technol, Inst Appl Phys, CH-1015 Lausanne, Switzerland
关键词
photocatalysis; sputtering; TiO(2) thin films; phenol degradation; XRD; AFM;
D O I
10.1016/S0926-3373(99)00123-X
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
TiO(2) thin films were prepared by direct current (dc) reactive sputtering, using various kinds of supports such as glass, silicon, alumina, and glass coated with indium-tin oxide. Samples were characterized by X-ray diffraction (XRD), and atomic force microscopy (AFM). Different TiO(2-x) stoichiometries, crystal structures and morphologies were obtained by changing the parameters of the reactive gas. The photocatalytic properties of the samples were tested on the degradation of phenol. The best efficiency in respect with phenol mineralization was obtained for samples prepared using an Ar-H(2)O mixture as the reactive gas. Indium-tin oxide supports provide the most efficient thin films. The catalytic efficiency per unit area of the sputtered films is at least one order of magnitude better than that of a 50 m(2) g(-1), reference TiO(2) powder. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:83 / 92
页数:10
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