Diffusion of quasiparticles in SIS tunnel junctions for X-ray spectroscopy

被引：7

作者：

Gomez, J

Luiten, OJ

vanLieshout, HL

vandenBerg, ML

Bruijn, MP

Kiewiet, FB

deKorte, PAJ

机构：

[1] Space Research Organization Netherlands, 3584 CA Utrecht

来源：

CZECHOSLOVAK JOURNAL OF PHYSICS | 1996年 / 46卷

关键词：

D O I：

10.1007/BF02570439

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

X-ray detectors based on Superconductor-Insulator-Superconductor (SIS) tunnel junctions have the potential of a very high energy resolution. We investigate limitations on the attainable energy resolution due to the combined effect of lateral diffusion of the excess quasiparticles, generated after absorption of an X-ray photon, and loss of the quasiparticles at the edges. We present an exactly solvable model, which we apply to recent X-ray measurements on a set of tunnel junctions which only differ in size. This clearly shows the detrimental influence of loss at the edges. The model gives quantitative criteria which have to be met to reach the desired 10 eV energy resolution for 6 keV photons.

引用

页码：2905 / 2906

页数：2

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