Acoustic microscopy for imaging and characterization

被引：8

作者：

Briggs, GAD

Kolosov, O

机构：

来源：

MRS BULLETIN | 1996年 / 21卷 / 10期

关键词：

D O I：

10.1557/S0883769400031614

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

[No abstract available]

引用

页码：30 / 35

页数：6

共 16 条

[1]

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[2]

Briggs GA., 1992, Acoustic microscopy

[3]

CREAN GM, 1995, ADV ACOUSTIC MICROSC, V1

[4]

CROSSEN JD, 1994, ADV CORROSION PROTEC, V2, P274

[5]

KNAUSS D, 1995, ADV ACOUST MICROS, V1, P49

[6] NONLINEAR DETECTION OF ULTRASONIC VIBRATIONS IN AN ATOMIC-FORCE MICROSCOPE [J].

KOLOSOV, O ;

YAMANAKA, K .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1993, 32 (8A) :L1095-L1098

[7]

KOLOSOV O, IN PRESS ACOUSTICAL, V22

[8]

KOLOSOV O, 1994, NANOSTRUCTURES QUANT, P349

[9]

KOLOSOV OV, 1993, Patent No. 1909

[10] CHARACTERIZATION OF 36-DEGREES-YX-LITAO3 WAFERS BY LINE-FOCUS-BEAM ACOUSTIC MICROSCOPY [J].

KUSHIBIKI, J ;

ISHIJI, H ;

KOBAYASHI, T ;

CHUBACHI, N ;

SAHASHI, I ;

SASAMATA, T .

IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL, 1995, 42 (01) :83-90

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