Interfacial Widths of Conjugated Polymer Bilayers

被引:36
作者
Wang, Cheng [2 ]
Garcia, Andres [1 ]
Yan, Hongping [2 ]
Sohn, Karen E. [4 ]
Hexemer, Alexander [3 ]
Nguyen, Thuc-Quyen [1 ]
Bazan, Guillermo C. [1 ,4 ]
Kramer, Edward J. [4 ,5 ]
Ade, Harald [2 ]
机构
[1] Univ Calif Santa Barbara, Dept Chem & Biochem, Santa Barbara, CA 93106 USA
[2] N Carolina State Univ, Dept Phys, Raleigh, NC 27695 USA
[3] Univ Calif Berkeley, Lawrence Berkeley Lab, Berkeley, CA 94720 USA
[4] Univ Calif Santa Barbara, Dept Mat, Santa Barbara, CA 93106 USA
[5] Univ Calif Santa Barbara, Dept Chem Engn, Santa Barbara, CA 93106 USA
基金
美国国家科学基金会;
关键词
X-RAY REFLECTIVITY; OPTOELECTRONIC DEVICES; POLYELECTROLYTES;
D O I
10.1021/ja905293m
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The interfaces of conjugated polyelectrolyte (CPE)/poly[2-methoxy-5-(2'-ethylhexyloxy)-p-phenylene vinylene] (MEH-PPV) bilayers cast from differential solvents are shown by resonant soft X-ray reflectivity (RSoXR) to be very smooth and sharp. The chemical interdiffusion due to casting is limited to less than 0.6 nm, and the interface created is thus nearly "molecularly" sharp. These results demonstrate for the first time and with high precision that the nonpolar MEH-PPV layer is not much disturbed by casting the CPE layer from a polar solvent. A baseline is established for understanding the role of interfacial structure in determining the performance of CIPE-based polymer light-emitting diodes. More broadly, we anticipate further applications of RSoXR as an important toot in achieving a deeper understanding of other multilayer organic optoelectronic devices, including multilayer photovoltaic devices.
引用
收藏
页码:12538 / +
页数:4
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