Nanocomposite CoPt:C films for extremely high-density recording

被引：157

作者：

Yu, M ^{[1
]}

Liu, Y

Moser, A

Weller, D

Sellmyer, DJ

机构：

[1] Univ Nebraska, Ctr Mat Res & Anal, Lincoln, NE 68588 USA

[2] IBM Corp, Almaden Res Ctr, San Jose, CA 95120 USA

[3] Univ Nebraska, Behlen Lab Phys, Lincoln, NE 68588 USA

[4] Univ Nebraska, Dept Mech Engn, Lincoln, NE 68588 USA

来源：

APPLIED PHYSICS LETTERS | 1999年 / 75卷 / 25期

关键词：

D O I：

10.1063/1.125516

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Nanocomposite CoPt:C films were investigated as potential media for extremely high-density recording. An annealing temperature of over 600 degrees C is necessary to form nanocomposite CoPt:C films consisting of C matrix and fct CoPt nanocrystallites with grain sizes of 8-20 nm and coercivities of 3-12 kOe. Coercivity and grain size increase with increasing annealing temperature and decreasing C concentration and they are insensitive to film thickness. The average activation volumes are about 0.9x10(-18) cm(3). The properties of these nanocomposite CoPt:C films can be tailored to satisfy the thermal stability, coercivity, and media noise requirements for extremely high-density recording. (C) 1999 American Institute of Physics. [S0003- 6951(99)00951-1].

引用

页码：3992 / 3994

页数：3

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