Interface study on heterostructured GaP-GaAs nanowires

被引:48
作者
Borgstrom, Magnus T.
Verheijen, Marcel A.
Immink, George
de Smet, Thierry
Bakkers, Erik P. A. M.
机构
[1] Philips Res Labs, NL-5656 AA Eindhoven, Netherlands
[2] Cedova, NL-5656 AA Eindhoven, Netherlands
关键词
D O I
10.1088/0957-4484/17/16/002
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The interface chemical composition of heterostructured GaP-GaAs nanowire segments was studied by the use of energy-dispersive x-ray analysis. An arsenic-rich tail in the GaP segments following GaAs could be minimized by reducing the AsH(3) molar fraction and the growth rate. For the temperature regime used for vapour-liquid-solid growth, we observe the opposite trend on interface sharpness compared to high-temperature layer-by-layer
引用
收藏
页码:4010 / 4013
页数:4
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