Abrasive wear on the atomic scale

被引：93

作者：

Gnecco, E ^{[1
]}

Bennewitz, R ^{[1
]}

Meyer, E ^{[1
]}

机构：

[1] Univ Basel, Inst Phys, CH-4056 Basel, Switzerland

来源：

PHYSICAL REVIEW LETTERS | 2002年 / 88卷 / 21期

关键词：

D O I：

10.1103/PhysRevLett.88.215501

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

A scanning force microscope in ultrahigh vacuum has been used to realize and detect atomic-scale abrasion on KBr(001). The continuous time evolution of the lateral force under scratching reveals that the wear mechanism is due to the removal and the rearrangement of single ion pairs. The debris is reorganized in regular terraces with the same periodicity and orientation as the unscratched surface, as in local epitaxial growth. The applied load has a strong influence on the abrasive process, whereas the scan velocity is less relevant.

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页码：4 / 215501

页数：4

相关论文

共 17 条

[1]

Ashcroft N. W., 1973, SOLID STATE PHYS

[2] Ultrathin films of NaCl on Cu(111):: a LEED and dynamic force microscopy study [J].

Bennewitz, R ;

Barwich, V ;

Bammerlin, M ;

Loppacher, C ;

Guggisberg, R ;

Baratoff, A ;

Meyer, E ;

Güntherodt, HJ .

SURFACE SCIENCE, 1999, 438 (1-3) :289-296

[3] TRIBOLOGICAL STUDIES OF SILICON FOR MAGNETIC RECORDING APPLICATIONS [J].

BHUSHAN, B ;

KOINKAR, VN .

JOURNAL OF APPLIED PHYSICS, 1994, 75 (10) :5741-5746

[4] NANOTRIBOLOGY - FRICTION, WEAR AND LUBRICATION AT THE ATOMIC-SCALE [J].

BHUSHAN, B ;

ISRAELACHVILI, JN ;

LANDMAN, U .

NATURE, 1995, 374 (6523) :607-616

[5] ATOMIC FORCE MICROSCOPE [J].

BINNIG, G ;

QUATE, CF ;

GERBER, C .

PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933

[6] Friction force microscopy investigations of potassium halide surfaces in ultrahigh vacuum: structure, friction and surface modification [J].

Carpick, RW ;

Dai, Q ;

Ogletree, DF ;

Salmeron, M .

TRIBOLOGY LETTERS, 1998, 5 (01) :91-102

[7] Friction experiments on the nanometre scale [J].

Gnecco, E ;

Bennewitz, R ;

Gyalog, T ;

Meyer, E .

JOURNAL OF PHYSICS-CONDENSED MATTER, 2001, 13 (31) :R619-R642

[8] Velocity dependence of atomic friction [J].

Gnecco, E ;

Bennewitz, R ;

Gyalog, T ;

Loppacher, C ;

Bammerlin, M ;

Meyer, E ;

Güntherodt, HJ .

PHYSICAL REVIEW LETTERS, 2000, 84 (06) :1172-1175

[9] MULTIFUNCTIONAL PROBE MICROSCOPE FOR FACILE OPERATION IN ULTRAHIGH-VACUUM [J].

HOWALD, L ;

MEYER, E ;

LUTHI, R ;

HAEFKE, H ;

OVERNEY, R ;

RUDIN, H ;

GUNTHERODT, HJ .

APPLIED PHYSICS LETTERS, 1993, 63 (01) :117-119

[10] SUBMICROMETER MODIFICATION OF POLYMER SURFACES WITH A SURFACE FORCE MICROSCOPE [J].

JIN, X ;

UNERTL, WN .

APPLIED PHYSICS LETTERS, 1992, 61 (06) :657-659