Light-modulated lock-in thermography for photosensitive pn-structures and solar cells

被引：28

作者：

Kaes, M ^{[1
]}

Seren, S ^{[1
]}

Pernau, T ^{[1
]}

Hahn, G ^{[1
]}

机构：

[1] Univ Konstanz, Dept Phys, D-7750 Constance, Germany

来源：

PROGRESS IN PHOTOVOLTAICS | 2004年 / 12卷 / 05期

关键词：

thermography; lock-in; shunt; contactless; multicrystalline; silicon; infrared;

D O I：

10.1002/pip.555

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

Lock-in thermography (LIT) is a well-established tool for defect analysis of solar cells, but so far has been restricted to the measurement of metallized samples. The new light-modulated lock-in thermography (LimoLIT) described in this paper overcomes this restriction by generating the voltage modulation needed for detection from photovoltaic conversion of modulated light. Thus wafers can be measured during all stages of fabrication, a pn-junction provided. The contactless LimoLIT method shows a stronger measurement signal and invokes a current flow close to illuminated operating conditions of solar cells, whereas conventional LIT is only comparable to a dark I-V measurement. Copyright (C) 2004 John Wiley Sons, Ltd.

引用

页码：355 / 363

页数：9

共 10 条

[1] On the data analysis of light-biased photoconductance decay measurements
Aberle, AG
Schmidt, J
Brendel, R
[J]. JOURNAL OF APPLIED PHYSICS, 1996, 79 (03) : 1491 - 1496
[2] [Anonymous], P 12 EUR PHOT SOL EN
[3] BREITENSTEIN O, 1998, P 2 WORLD C PHOT SOL, P1382
[4] Breitenstein O., 2003, Lock-in thermography: basics and use for functional diagnostics of electronic components
[5] DAUNER M, 1997, P 26 IEEE PVSC AN, P1137
[6] Hahn G, 2003, WORL CON PHOTOVOLT E, P1285
[7] Maldague XPV, 2001, WILEY MICRO, pXV
[8] Phase-sensitive LBIC analysis
Pemau, T
Fath, P
Bucher, E
[J]. CONFERENCE RECORD OF THE TWENTY-NINTH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE 2002, 2002, : 442 - 445
[9] Rogalski A, 2002, OPTO-ELECTRON REV, V10, P111
[10] STRYIHIPP G, 1993, P 23 IEEE PHOT SPEC, P303

← 1 →