Summary of ISO/TC201 technical report:: ISO/TR 118392:: 2005 -: Surface chemical analysis -: X-ray photoelectron spectroscopy -: Procedures for determining backgrounds

被引：7

作者：

Koever, L. ^{[1
]}

机构：

[1] Hungarian Acad Sci MTA ATOMKI, Inst Nucl Res, H-4001 Debrecen, Hungary

来源：

SURFACE AND INTERFACE ANALYSIS | 2006年 / 38卷 / 07期

关键词：

XPS; X-ray photoelectron spectroscopy; ISO; International Organization for Standardization; background determination; inelastic and elastic electron scattering; quantitative surface analysis;

D O I：

10.1002/sia.2365

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

ISO Technical Report 18392 provides the guidance for determining backgrounds in X-ray photoelectron spectra. The methods of background determination described in this report are applicable for the quantitative evaluation of the spectra of photoelectrons and Auger electrons excited by X-rays from solid surfaces and surface nanostructures. Copyright (C) 2006 John Wiley & Sons, Ltd.

引用

页码：1173 / 1175

页数：3

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