Dependence of optical constants of AZ(R)BARLi(TM) bottom coating on bake conditions

被引:8
作者
Dammel, RR
Sagan, J
Synowicki, RA
机构
来源
ADVANCES IN RESIST TECHNOLOGY AND PROCESSING XIV | 1997年 / 3049卷
关键词
AZ(R)BARLi(TM) bottom coat; spectroscopic ellipsometry; refractive index; antireflection layer;
D O I
10.1117/12.275896
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The optical constants of AZ(R)BARLi(TM) bottom coat have been determined by spectroscopic ellipsometry as a function of bake conditions. Cauchy parameters are reported as a function of bake conditions for three film thicknesses, corresponding to the first three minima of the reflectivity vs. AZ(R)BARLi(TM) film thickness curve. Full dispersion curves were obtained for constant spin speed and constant thickness conditions. It is found that the k dispersion curves show a slope change at 160 - 170 degrees C bake temperature which is tentatively attributed to dye depletion and the formation of a graded layer in the bottom coat.
引用
收藏
页码:963 / 973
页数:11
相关论文
empty
未找到相关数据