Refinement of powder diffraction data collected using imaging plates

被引：1

作者：

Cookson, DJ ^{[1
]}

Foran, GJ ^{[1
]}

Hunter, BA ^{[1
]}

Ismunandar ^{[1
]}

Kennedy, BJ ^{[1
]}

机构：

[1] UNIV SYDNEY, SCH CHEM, SYDNEY, NSW 2006, AUSTRALIA

来源：

EUROPEAN POWDER DIFFRACTION: EPDIC IV, PTS 1 AND 2 | 1996年 / 228卷

关键词：

synchrotron radiation; Rietveld refinement; tin dioxide; tungsten dioxide; germanium dioxide; imaging plates;

D O I：

10.4028/www.scientific.net/MSF.228-231.113

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Powder diffraction data for samples of SnO2, WO2 and GeO2 have been collected at lambda = 0.65, 1.0, and 1.3 Angstrom respectively using imaging plates on the powder diffractometer at the Australian National Beamline Facility at the Photon Factory, Japan. The time dependent decay of the imaging plates is not a problem in the successful Rietveld type refinement of the powder diffraction data. Other issues addressed include the accuracy with which the imaging plates can be located and the effects of fluorescence and absorption in choosing optimal experimental conditions.

引用

页码：113 / 118

页数：6

共 7 条

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