Laser-micromachined defect arrays for DC potential drop fatigue studies

被引:1
作者
Arnold, CB [1 ]
Pratap, B [1 ]
Piqué, A [1 ]
Geltmacher, AB [1 ]
Thomas, JP [1 ]
机构
[1] Princeton Univ, Dept Mech & Aerosp Engn, Princeton, NJ 08544 USA
来源
PHOTON PROCESSING IN MICROELECTRONICS AND PHOTONICS III | 2004年 / 5339卷
关键词
D O I
10.1117/12.537794
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The experimental characterization of fatigue crack initiation and growth of structural materials can be very expensive and time consuming. Fatigue specimens are typically controlled by a single dominant defect and several specimens are needed to examine the fatigue response for each loading condition of interest. Time and expense add up as millions of load cycles are sometimes required to initiate a crack, and replicate tests are necessary to characterize the inherent statistical nature of fatigue. In order to improve the efficiency of experimentation, we are developing laser-based techniques to produce fatigue test samples with arrays of defects. Controlled arrays of oval shaped micro-defects are laser-micromachined in titanium alloy (Ti-6Al-4V). Crack initiation from the individual defects in the arrays is monitored using a DC potential drop technique. Results indicate the utility of this approach in multiplying the amount of fatigue data generated per specimen-test. The new fatigue test approach is applicable to a wide range of material systems and initial defect structures.
引用
收藏
页码:298 / 303
页数:6
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