Structures and energetics of defects: a comparative study of 3C-and 4H-SiC

被引:11
作者
Gao, F
Posselt, M
Belko, V
Zhang, Y
Weber, WJ
机构
[1] Pacific NW Natl Lab, Fundamental Sci Directorate, Richland, WA 99352 USA
[2] Forschungszentrum Rossendorf EV, Inst Ion Beam Phys & Mat Res, D-01314 Dresden, Germany
关键词
defects and defect properties; computer simulations; 3C-and; 4H-SiC;
D O I
10.1016/j.nimb.2003.12.028
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The structures, formation energies and stable configurations of elementary defects (vacancies, antisite defects and self-interstitials) in 3C- and 4H-SiCare studied using classical molecular dynamics simulation with a recently developed interatomic potential. The defect structures in 3C-SiC are relatively simple, but those in 4H-SiC are more complex. The interstitials between hexagonal and. trigonal rings are characteristic for 4H-SiC and other hexagonal polytypes, but not for 3C-SiC. The number of non-equivalent defects in 4H-SiC is much higher than that in 3C-SiC, and a considerable difference is found for some complex and anisotropic defects, in particular for the dumbbells D1Si-Si, D1Si-C and D2Si-C. The lattice deformation beyond the first nearest neighbor shell, which depends strongly on the polytype structure, plays an important role on these effects. However, the polytypism does not have a significant influence on the structure and energetics of the more compact and isotropic defects, such as vacancies and antisite defects. Despite the complexity of defect configurations, the tetrahedral interstitials have very similar properties in 3C- and 4H-SiC because their first, second and third nearest neighbor shells are identical. (C) 2003 Elsevier B.V. All rights reserved.
引用
收藏
页码:74 / 79
页数:6
相关论文
共 10 条
[1]   Amorphization and recrystallization of covalent tetrahedral networks [J].
Bolse, W .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1999, 148 (1-4) :83-92
[2]  
Gao F, 2002, NUCL INSTRUM METH B, V191, P504, DOI 10.1016/S0168-583X(02)00600-6
[3]   Ab initio and empirical-potential studies of defect properties in 3C-SiC -: art. no. 245208 [J].
Gao, F ;
Bylaska, EJ ;
Weber, WJ ;
Corrales, LR .
PHYSICAL REVIEW B, 2001, 64 (24)
[4]   MOLECULAR-DYNAMICS DETERMINATION OF DEFECT ENERGETICS IN BETA-SIC USING 3 REPRESENTATIVE EMPIRICAL POTENTIALS [J].
HUANG, HC ;
GHONIEM, NM ;
WONG, JK ;
BASKES, MI .
MODELLING AND SIMULATION IN MATERIALS SCIENCE AND ENGINEERING, 1995, 3 (05) :615-627
[5]   Characterization of phosphorus implantation in 4H-SiC [J].
Khemka, V ;
Patel, R ;
Ramungul, N ;
Chow, TP ;
Ghezzo, M ;
Kretchmer, J .
JOURNAL OF ELECTRONIC MATERIALS, 1999, 28 (03) :167-174
[6]   Next-generation nuclear power [J].
Lake, JA ;
Bennett, RG ;
Kotek, JF .
SCIENTIFIC AMERICAN, 2002, 286 (01) :72-81
[7]   Fission product release behavior of individual coated fuel particles for high-temperature gas-cooled reactors [J].
Minato, K ;
Sawa, K ;
Koya, T ;
Tomita, T ;
Ishikawa, A ;
Baldwin, CA ;
Gabbard, WA ;
Malone, CM .
NUCLEAR TECHNOLOGY, 2000, 131 (01) :36-47
[8]  
POSSELT M, UNPUB J PHYS CONENS
[9]   Antisites in silicon carbide [J].
Torpo, L ;
Poykko, S ;
Nieminen, RM .
PHYSICAL REVIEW B, 1998, 57 (11) :6243-6246
[10]   CHEMICAL-POTENTIAL DEPENDENCE OF DEFECT FORMATION ENERGIES IN GAAS - APPLICATION TO GA SELF-DIFFUSION [J].
ZHANG, SB ;
NORTHRUP, JE .
PHYSICAL REVIEW LETTERS, 1991, 67 (17) :2339-2342