Crack patterns in thin films

被引：310

作者：

Xia, ZC

Hutchinson, JW

机构：

[1] Harvard Univ, Div Engn & Appl Sci, Cambridge, MA 02138 USA

[2] Ford Res Lab, Mfg Syst Dept, Dearborn, MI 48121 USA

来源：

JOURNAL OF THE MECHANICS AND PHYSICS OF SOLIDS | 2000年 / 48卷 / 6-7期

基金：

美国国家科学基金会;

关键词：

crack propagation; thin films; integral equations;

D O I：

10.1016/S0022-5096(99)00081-2

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A two-dimensional model of a film bonded to an elastic substrate is proposed for simulating crack propagation paths in thin elastic films. Specific examples are presented for films subject to equi-biaxial residual tensile stress. Single and multiple crack geometries are considered with a view to elucidating some of the crack patterns which are observed to develop. Tendencies for propagating cracks to remain straight or curve are explored as a consequence of crack interaction. The existence of spiral paths is demonstrated. (C) 2000 Elsevier Science Ltd. All rights reserved.

引用

页码：1107 / 1131

页数：25

共 21 条

[1]

[Anonymous], STRESS ANAL CRACKS H

[2] SURFACE CRACKS ON GLASS [J].