Measurement of elastic shear strain by white-beam SR topography

被引：1

作者：

Brádler, J

Polcarová, M

Gemperlová, J

George, A

Jacques, A

机构：

[1] Inst Phys AS CR, Prague 18221 8, Czech Republic

[2] Ecole Mines, Phys Mat Lab, F-54042 Nancy, France

来源：

PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES | 1999年 / 357卷 / 1761期

关键词：

small elastic strain; synchrotron radiation topography;

D O I：

10.1098/rsta.1999.0459

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

An external tensile stress applied to an elastically anisotropic cubic material along a direction different to that of the cubic axes can cause a shear deformation. In bicrystals the shear strain can result in a mutual tilt of some planes at the grain boundary. Taking advantage of the high sensitivity of the white-beam synchrotron radiation topography to the tilt of diffracting planes, the small elastic shear strain was measured using suitable bicrystals.

引用

页码：2701 / 2705

页数：5