Infrared surface plasmons in two-dimensional silver nanoparticle arrays in silicon

被引:95
作者
Mertens, H
Verhoeven, J
Polman, A
Tichelaar, FD
机构
[1] FOM, Inst AMOLF, NL-1098 SJ Amsterdam, Netherlands
[2] Natl Ctr HREM, NL-2628 AL Delft, Netherlands
关键词
D O I
10.1063/1.1784542
中图分类号
O59 [应用物理学];
学科分类号
摘要
We present two-dimensional arrays of silver nanoparticles embedded in amorphous silicon, fabricated by a sequential Si/Ag/Si electron-beam evaporation process. The particle arrays exhibit surface plasmon resonance spectra in the near-infrared (0.9 eV), with tails extending below 0.5 eV. The data are compared with calculations that take into account measured particle size, shape anisotropy, and separation. It is concluded that the large redshift is mainly due to the high refractive index of the matrix, with shape anisotropy and interparticle coupling contributing several tenths of an electron volt. This work enables plasmon-related applications at the telecommunication wavelength of 1.5 mum (0.8 eV). (C) 2004 American Institute of Physics.
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页码:1317 / 1319
页数:3
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