Adhesion maps using scanning force microscopy techniques

被引：16

作者：

De Pablo, PJ

Colchero, J

Gomez-Herrero, J

Baro, AM

Schaefer, DM

Howell, S

Walsh, B

Reifenberger, R ^{[1
]}

机构：

[1] Purdue Univ, Dept Phys, W Lafayette, IN 47907 USA

[2] Towson Univ, Dept Phys, Towson, MD 21234 USA

[3] Univ Autonoma Madrid, Dept Fis Mat Condensada, E-28049 Madrid, Spain

来源：

JOURNAL OF ADHESION | 1999年 / 71卷 / 04期

关键词：

microscopic adhesion; spatially resolved adhesion; Atomic Force Microscope (AFM); Scanning Force Microscope (SFM);

D O I：

10.1080/00218469908014547

中图分类号：

TQ [化学工业];

学科分类号：

0817 ;

摘要：

A technique has been developed that allows a real-time measurement of the lift-off force required to remove a scanning force microscope tip from a substrate. Both topography and adhesion maps are obtained simultaneously, allowing the correlation between topography and adhesion properties to be studied. Quantitative values of important adhesion parameters can be extracted from these data. A number of examples are given which illustrate the utility of this technique.

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收藏

页码：339 / 356

页数：18

相关论文

共 19 条

[1] FORMATION OF MONOLAYER PITS OF CONTROLLED NANOMETER SIZE ON HIGHLY ORIENTED PYROLYTIC-GRAPHITE BY GASIFICATION REACTIONS AS STUDIED BY SCANNING TUNNELING MICROSCOPY [J].

CHANG, HP ;

BARD, AJ .

JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1990, 112 (11) :4598-4599

[2] A NONDESTRUCTIVE METHOD FOR DETERMINING THE SPRING CONSTANT OF CANTILEVERS FOR SCANNING FORCE MICROSCOPY [J].

CLEVELAND, JP ;

MANNE, S ;

BOCEK, D ;

HANSMA, PK .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1993, 64 (02) :403-405

[3] AN EVALUATION OF THE USE OF THE ATOMIC FORCE MICROSCOPE FOR STUDIES IN NANOMECHANICS [J].

COHEN, SR .

ULTRAMICROSCOPY, 1992, 42 :66-72

[4] Observation of liquid neck formation with scanning force microscopy techniques [J].

Colchero, J ;

Storch, A ;

Luna, M ;

Gomez-Herrero, J ;

Baro, AM .

LANGMUIR, 1998, 14 (09) :2230-2234

[5] Jumping mode scanning force microscopy [J].

de Pablo, PJ ;

Colchero, J ;

Gómez-Herrero, J ;

Baró, AM .

APPLIED PHYSICS LETTERS, 1998, 73 (22) :3300-3302

[6] Contact electrification and the interaction force between a micrometer-size polystyrene sphere and a graphite surface [J].

Gady, B ;

Reifenberger, R ;

Rimai, DS ;

DeMejo, LP .

LANGMUIR, 1997, 13 (09) :2533-2537

[7] Identification of electrostatic and van der Waals interaction forces between a micrometer-size sphere and a flat substrate [J].

Gady, B ;

Schleef, D ;

Reifenberger, R ;

Rimai, D ;

DeMejo, LP .

PHYSICAL REVIEW B, 1996, 53 (12) :8065-8070

[8] The interaction between micrometer-size particles and flat substrates: A quantitative study of jump-to-contact [J].

Gady, B ;

Schleef, D ;

Reifenberger, R ;

Rimai, DS .

JOURNAL OF ADHESION, 1998, 67 (1-4) :291-305

[9]

HAYS DA, 1995, FUNDAMENTALS ADHESIO, P61

[10] SURFACE ENERGY AND CONTACT OF ELASTIC SOLIDS [J].

JOHNSON, KL ;

KENDALL, K ;

ROBERTS, AD .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1971, 324 (1558) :301-&