High-resolution X-ray diffraction analysis of magnetically aligned high-T-c superconducting ceramics

A large range of magnetically treated superconducting ceramics has been investigated using new high-resolution X-ray diffractometers in combination with different integration techniques to obtain quantitative and qualitative results on the degree of alignment. The diffractometers combine and enhance the flexibility of a 4-circle diffractometer with the possibility to use it as a bond camera and as grazing incidence surface diffractometer. The X-ray beam is strictly monochromatic (CuK alpha(1)) and focused with a long focal length on the sample. The sample goniometer can be rotated and shifted around three perpendicular axes and two translation directions, respectively. The instruments are equipped with 1D and 2D detectors and their distance to the sample can be varied between 10 and 30 cm. In our contribution we describe the experimental methods connected with this special equipment, their application to the analysis of the degree of alignment in high T-c superconducting ceramics and compare the results to those obtained by standard diffraction methods.