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Patch clamping moves to chips
被引：11
作者：
Neubert, HJ
机构：
关键词：
D O I：
10.1021/ac041624g
中图分类号：
O65 [分析化学];
学科分类号：
070302 ;
081704 ;
摘要：
The patch clamp method of measuring the electrical currents through ion channels is a laborious technique restricted to highly skilled practitioners. Hanns-J. Neubert discusses the promise and limitations of commercial chips that are designed to eliminate the handwork and make patch clamping high-throughput.
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页码：327A / 330A
页数：4
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