Capillarity driven motion of solid film wedges

被引:32
作者
Wong, H [1 ]
Miksis, MJ [1 ]
Voorhees, PW [1 ]
Davis, SH [1 ]
机构
[1] NORTHWESTERN UNIV,DEPT MAT SCI & ENGN,EVANSTON,IL 60208
关键词
D O I
10.1016/S1359-6454(96)00351-5
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A solid film freshly deposited on a substrate may form a non-equilibrium contact angle with the substrate, and will evolve. This morphological evolution near the contact line is investigated by studying the motion of a solid wedge on a substrate. The contact angle of the wedge changes at time t = 0 from the wedge angle alpha to the equilibrium contact angle beta, and its effects spread into the wedge via capillarity-driven surface diffusion. The film profiles at different times are found to be self-similar; with the length scale increasing as t(1/4). The self-similar film profile is determined numerically by a shooting method for alpha and beta between 0 and 180 degrees. In general, we find that the film remains a wedge when alpha = beta. For alpha < beta, the film retracts, whereas for alpha > beta, the film extends. For alpha = 90 degrees, the results describe the growth of grain-boundary grooves for arbitrary dihedral angles. For beta = 90 degrees, the solution also applies to a free-standing wedge, and the thin-wedge profiles agree qualitatively with those observed in transmission electron microscope specimens. (C) 1997 Acta Metallurgica Inc.
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收藏
页码:2477 / 2484
页数:8
相关论文
共 20 条
[1]  
[Anonymous], 1973, INTRO PROPERTIES CRY
[2]  
Bender C. M., 1999, Advanced Mathematical Methods for Scientists and Engineers, V1
[3]  
Brown R.G.W., 1995, THIN FILM COATINGS O, P551
[4]  
BURGER RM, 1995, SOLID STATE TECH FEB, P38
[5]   CAPILLARY INSTABILITIES IN THIN-FILMS - A MODEL OF THERMAL PITTING AT GRAIN-BOUNDARY VERTICES [J].
GENIN, FY ;
MULLINS, WW ;
WYNBLATT, P .
ACTA METALLURGICA ET MATERIALIA, 1992, 40 (12) :3239-3248
[6]  
Gjostein N.A., 1963, MET SURFACES STRUCT, P99
[7]   MEASUREMENT AND ANALYSIS OF GRAIN-BOUNDARY GROOVING BY VOLUME DIFFUSION [J].
HARDY, SC ;
MCFADDEN, GB ;
CORIELL, SR ;
VOORHEES, PW ;
SEKERKA, RF .
JOURNAL OF CRYSTAL GROWTH, 1991, 114 (03) :467-480
[8]  
Herring C., 1951, Phys. Powder Metall., V27, P143
[9]  
Jayaram G., 1995, Interface Science, V2, P379, DOI 10.1007/BF00222625
[10]   CAPILLARY INSTABILITIES IN THIN-FILMS [J].
JIRAN, E ;
THOMPSON, CV .
JOURNAL OF ELECTRONIC MATERIALS, 1990, 19 (11) :1153-1160