Observations on the creep behavior of fully-lamellar polycrystalline TiAl: Identification of critical effects

被引：93

作者：

Parthasarathy, TA

Mendiratta, MG

Dimiduk, DM

机构：

[1] Materials Directorate, Wright Laboratory, WL/MLLM, Wright-Patterson AFB, Dayton

[2] UES, Inc., Dayton, OH 45432

来源：

SCRIPTA MATERIALIA | 1997年 / 37卷 / 03期

关键词：

D O I：

10.1016/S1359-6462(97)00099-7

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

[No abstract available]

引用

页码：315 / 321

页数：7

共 35 条

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