Phase-sensitive near-field imaging of metal nanoparticles

被引：37

作者：

Prikulis, J ^{[1
]}

Xu, H

Gunnarsson, L

Käll, M

Olin, H

机构：

[1] Chalmers Univ Technol, Dept Appl Phys, SE-41296 Gothenburg, Sweden

[2] Chalmers Univ Technol, Dept Expt Phys, SE-41296 Gothenburg, Sweden

来源：

JOURNAL OF APPLIED PHYSICS | 2002年 / 92卷 / 10期

关键词：

D O I：

10.1063/1.1516249

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We report on the near-field imaging of silver nanoparticles using an aperture-type near-field microscope operated in illumination mode. The nanoparticles are imaged as interference patterns, due to far-field superposition of the optical fields emitted from the tip and elastically scattered from localized surface plasmons (SP). Aperture-type probe can thus be used to obtain information on the phase shift associated with localized SP coupling at the illumination wavelength. (C) 2002 American Institute of Physics.

引用

页码：6211 / 6214

页数：4

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