Precision measurements of the total photoionization cross-sections of He, Ne, Ar, Kr, and Xe

被引：205

作者：

Samson, JAR

Stolte, WC

机构：

[1] Univ Nebraska, Behlen Lab Phys, Lincoln, NE 68588 USA

[2] Univ Nevada, Dept Chem, Las Vegas, NV 89154 USA

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 2002年 / 123卷 / 2-3期

关键词：

photoionization cross-sections; helium; neon; argon; krypton; xenon;

D O I：

10.1016/S0368-2048(02)00026-9

中图分类号：

O433 [光谱学];

学科分类号：

0703 [化学]; 070302 [分析化学];

摘要：

Absolute photoionization cross-sections for the rare gases have been measured from threshold to 125 eV with an accuracy of +/-1 to 3% and are presented in both tabular and graphical form. These data are compared with the optical oscillator strength measurements of Brion and co-workers, who used the Dipole (e, e) collision technique. (C) 2002 Elsevier Science B.V. All rights reserved.

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页码：265 / 276

页数：12

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