Bispectral analysis for on-line monitoring of stamping operation

被引:34
作者
Zhang, GC [1 ]
Ge, M [1 ]
Tong, H [1 ]
Xu, Y [1 ]
Du, R [1 ]
机构
[1] Chinese Univ Hong Kong, Dept Automat & Comp Aided Engn, Hong Kong, Hong Kong, Peoples R China
关键词
condition monitoring; stamping process; higher order statistics; bispectral analysis;
D O I
10.1016/S0952-1976(02)00007-6
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Owing to the ever-increased demand for product quality improvement and production cost reduction, on-line monitoring of stamping operations has become a common practice in shop floors around the world today. Based on a market survey, for most stamping processes, monitoring systems use tonnage signals and/or strain signals. Recently, a few attempts have been reported using acceleration signals as they contain rich information and are relatively inexpensive. However, it is known that acceleration signals are vulnerable to the noise disturbances, and hence are less robust. This paper presents a study that uses bispectrum to analyze the acceleration signals. It is shown that the bispectrum can suppress Gaussian color noise to boost the signal-to-noise ratio. It also extracts the features of the signal that are related to the defective parts (such as material too thick or slug). The experimental results demonstrate that the method presented is effective and has a good potential for applications in shop floor. We also present new method for reducing the computation load in the process. (C) 2002 Published by Elsevier Science Ltd.
引用
收藏
页码:97 / 104
页数:8
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