Structures and morphologies of cast and plastically strained polyamide 6 films as evidenced by confocal Raman microspectroscopy and atomic force microscopy

被引:39
作者
Ferreiro, V
Depecker, C
Laureyns, J
Coulon, G
机构
[1] Univ Sci & Tech Lille Flandres Artois, CNRS, Lab Struct & Proprietes Etat Solide, F-59655 Villeneuve Dascq, France
[2] Univ Sci & Tech Lille Flandres Artois, CNRS, Lab Spectrochim Infrarouge & Ramon, Ctr Etud Rech Lasers & Applicat, F-59655 Villeneuve Dascq, France
关键词
Raman microspectroscopy; semicrystalline polymers; atomic force microscopy;
D O I
10.1016/j.polymer.2004.06.018
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
Both confocal Raman microspectroscopy and atomic force microscopy (AFM) have been undertaken to study the crystalline and the morphological aspects of cast PA 6 films at a sub-microscopic scale. The percentages of the different crystalline structures present within PA 6 cast films, i.e. the monoclinic alpha, the pseudo-hexagonal beta, and the monoclinic gamma, have been measured by confocal Raman microspectroscopy. In cast films, the prevailing structure is the beta one. AFM has been used to characterize the morphology of the PA 6 films. Simultaneously, the deformed state has been considered as well. Our main interest has been to follow the evolution of the percentage of each crystalline structure as a function of the plastic deformation mechanisms which are responsible of the yielding of PA 6 films: shear banding for temperatures T lower than 160 degreesC and formation of fibrils for T > 160 'C. (C) 2004 Elsevier Ltd. All rights reserved.
引用
收藏
页码:6013 / 6026
页数:14
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