Applications of the particle ordering technique for conductive antireflection films

被引:36
作者
Ishihara, Y [1 ]
Hirai, T [1 ]
Sakurai, C [1 ]
Koyanagi, T [1 ]
Nishida, H [1 ]
Komatsu, M [1 ]
机构
[1] Catalysts & Chem Ind Co Ltd, Fine Chem Res Ctr, Wakamatsu Ku, Fukuoka 8080027, Japan
关键词
particle ordering technique; conductive anti-reflection films; nanoparticles; porous silica nanoparticles; wide reflection curve;
D O I
10.1016/S0040-6090(02)00186-4
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Our particle ordering technique of several nanoparticles was applied to anti-reflection coating films, which consist of a double-layer structure formed by spin-coating, for commercial computer displays. These double-layered coating films are composed of ordered conductive nanoparticles such as antimony-doped tin oxides (ATO), indium-tin oxides (ITO) and noble metals in the 1st layer and silica matrix in the 2nd layer. The sheet resistance of the double-layered conductive anti-reflection films can be controlled from 10(3) Ohm/sq. to 10(7) Ohm/sq. by varying ingredient of the 1st layer. And by forming nanoparticles ordered 1st layer in the double-layered coating film, we were successful in realizing a low reflectance in any visible wavelength region (a wide reflection curve), due to an inclining refractive index structure. Furthermore, in the 2nd layer composed of 50 rim porous silica nanoparticles with a unique core-shell structure and a silica matrix, which indicates a lower refractive index, the reflectance is significantly reduced in any visible wavelength region. (C) 2002 Elsevier Science B.V All rights reserved.
引用
收藏
页码:50 / 55
页数:6
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