Measurements of the hemispherical scattering distribution function of rough dielectric surfaces

被引：13

作者：

Chaikina, EI ^{[1
]}

Negrete-Regagnon, P ^{[1
]}

Ruiz-Cortés, V ^{[1
]}

Méndez, ER ^{[1
]}

机构：

[1] Ctr Invest Cient & Educ Super Ensenada, Div Fis Aplicada, Ensenada 22860, Baja California, Mexico

来源：

OPTICS COMMUNICATIONS | 2002年 / 208卷 / 4-6期

关键词：

scattering; backscattering; enhanced backscattering;

D O I：

10.1016/S0030-4018(02)01581-X

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We present measurements of the hemispherical distribution function of the mean intensity scattered by randomly rough isotropic dielectric surfaces, The surface profiles, etched on photoresist, constitute a good approximation to Gaussian random processes with Gaussian correlation functions. The experimental situation approximates the case in which the light is scattered by the rough interface between air and a semi-infinite dielectric medium, illuminated from the air side. The results show features that can be attributed to multiple scattering. For the rougher sample. a well-defined enhanced backscattering peak is observed in both, the co- and cross-polarized scattering measurements. (C) 2002 Elsevier Science B.V. All rights reserved.

引用

页码：215 / 221

页数：7

共 21 条

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