Lateral resolution enhancement with standing evanescent waves

被引:106
作者
Cragg, GE [1 ]
So, PTC [1 ]
机构
[1] MIT, Dept Mech Engn, Cambridge, MA 02139 USA
关键词
D O I
10.1364/OL.25.000046
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A high-resolution fluorescence microscopy technique has been developed that achieves a lateral resolution of better than one sixth of the emission wavelength (FWHM). By use of a total-internal-reflection geometry, standing evanescent waves are generated that spatially modulate the excitation of the sample. An enhanced two-dimensional image is formed from a weighted sum of images taken at different phases and directions of the standing wave. The performance of such a system is examined through theoretical calculations of both the point-spread function and the optical transfer function. (C) 2000 Optical Society of America.
引用
收藏
页码:46 / 48
页数:3
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