JECP/PCED - a computer program for simulation of polycrystalline electron diffraction pattern and phase identification

被引：17

作者：

Li, XZ ^{[1
]}

机构：

[1] Univ Nebraska, Ctr Mat Res & Anal, Lincoln, NE 68588 USA

来源：

ULTRAMICROSCOPY | 2004年 / 99卷 / 04期

关键词：

electron diffraction; polycrystalline phase; computer software;

D O I：

10.1016/j.ultramic.2004.01.006

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

A computer program for simulation of polycrystalline electron diffraction pattern and phase identification is described. In addition to simulating electron diffraction pattern for a single phase, the program has the ability to model two phases with selected mass ratio. Experimental polycrystalline electron diffraction patterns can be directly compared to simulated patterns for phase identification. Examples of how to use the program are also given. (C) 2004 Elsevier B.V. All rights reserved.

引用

页码：257 / 261

页数：5

共 5 条

[1]

James R.W., 1982, OPTICAL PRINCIPLES D

[2]

LABAR JL, 2000, P EUREM 12, P1379

[3]

LYMAN CE, 1993, ELECT DIFFRACTION TE, V2

[4] Robust parameterization of elastic and absorptive electron atomic scattering factors [J].

Peng, LM ;

Ren, G ;

Dudarev, SL ;

Whelan, MJ .

ACTA CRYSTALLOGRAPHICA SECTION A, 1996, 52 (02) :257-276

[5] Exchange-coupled nanocomposite magnets by nanoparticle self-assembly [J].

Zeng, H ;

Li, J ;

Liu, JP ;

Wang, ZL ;

Sun, SH .

NATURE, 2002, 420 (6914) :395-398

← 1 →