Microprobe x-ray fluorescence with the use of point-focusing diffractors

被引:16
作者
Chen, ZW
Wittry, DB
机构
[1] Dept. of Mat. Sci. and Engineering, University of Southern California, Los Angeles
关键词
D O I
10.1063/1.119427
中图分类号
O59 [应用物理学];
学科分类号
摘要
A toroidal point-focusing mica crystal diffractor was used to focus monochromatic x rays from a microfocus x-ray source operated at 0.1 mA and 30 kV, The Cu K-alpha x-ray focal spot of 50 mu m x 85 mu m had 1.6 x 10(4) photons/s/mu m(2). Microprobe x-ray fluorescence (MXRF) spectra were recorded with a Si(Li) energy dispersive detector for bulk specimens of GaAs. Si, and Muscovite. Low background due to monochromatic excitation resulted in predicted detection limits as low as 2 ppm for a measurement time of 500 s. Laboratory MXRF systems based on point-focusing diffractors were shown to provide lower detection limits. larger working distance, and higher theoretical intensity than systems using capillary optics. (C) 1997 American Institute of Physics.
引用
收藏
页码:1884 / 1886
页数:3
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