Ultrathin glass for flexible OLED application

被引：72

作者：

Auch, MDJ

Soo, OK

Ewald, G

Soo-Jin, C

机构：

[1] Inst Mat Res & Engn, Singapore 117602, Singapore

[2] Infineon Technol, Singapore 349249, Singapore

来源：

THIN SOLID FILMS | 2002年 / 417卷 / 1-2期

关键词：

flexible OLED; ultrathin glass; bending test;

D O I：

10.1016/S0040-6090(02)00647-8

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The mechanical behavior of ultrathin glass was examined with respect to its use as a substrate and encapsulating cover for flexible displays. Using a simple theoretical model for large deformation buckling, the radius of curvature for different bending conditions of the flexible substrate can be calculated. This leads to a relationship between the thickness of glass substrate, space between the substrate and the cover glass and the minimum bending radius. (C) 2002 Elsevier Science B.V. All rights reserved.

引用

页码：47 / 50

页数：4

共 13 条

[1]

[Anonymous], 1973, STABILITY ELASTIC SY

[2] LIGHT-EMITTING-DIODES BASED ON CONJUGATED POLYMERS [J].

BURROUGHES, JH ;

BRADLEY, DDC ;

BROWN, AR ;

MARKS, RN ;

MACKAY, K ;

FRIEND, RH ;

BURN, PL ;

HOLMES, AB .

NATURE, 1990, 347 (6293) :539-541

[3] RELIABILITY AND DEGRADATION OF ORGANIC LIGHT-EMITTING DEVICES [J].

BURROWS, PE ;

BULOVIC, V ;

FORREST, SR ;

SAPOCHAK, LS ;

MCCARTY, DM ;

THOMPSON, ME .

APPLIED PHYSICS LETTERS, 1994, 65 (23) :2922-2924

[4]

CHEN Z, 2001, IN PRESS ENG FRACT M

[5]

COTTERELL B, 2001, UNPUB J ELECT PACKAG

[6]

GRAFF GL, 2000, 43 ANN TECHN C P SOC, P397

[7] Correlation between dark spot growth and pinhole size in organic light-emitting diodes [J].

Lim, SF ;

Ke, L ;

Wang, W ;

Chua, SJ .

APPLIED PHYSICS LETTERS, 2001, 78 (15) :2116-2118

[8] Degradation in organic light-emitting diodes [J].

Nguyen, TP ;

Jolinat, P ;

Destruel, P ;

Clergereaux, R ;

Farenc, J .

THIN SOLID FILMS, 1998, 325 (1-2) :175-180

[9]

ROSS Y, 2000, FPD MARKET UPDATE SP

[10] Failure modes in polymer-based light-emitting diodes [J].

Sheats, JR ;

Roitman, DB .

SYNTHETIC METALS, 1998, 95 (02) :79-85

← 1 2 →