Aging properties of high power laser diode arrays analyzed by Fourier-transform photocurrent measurements

被引：31

作者：

Tomm, JW ^{[1
]}

Jaeger, A ^{[1
]}

Barwolff, A ^{[1
]}

Elsaesser, T ^{[1
]}

Gerhardt, A ^{[1
]}

Donecker, J ^{[1
]}

机构：

[1] INST KRISTALLZUCHTUNG,D-12489 BERLIN,GERMANY

来源：

APPLIED PHYSICS LETTERS | 1997年 / 71卷 / 16期

关键词：

D O I：

10.1063/1.120066

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We present the results on aging mechanisms acting in high-power laser diode arrays (LDAs) employing Fourier-transform (FT) spectroscopy. The FT spectrometer was used as an excitation source for performing photocurrent (PC) measurements in two sets of aged LDA samples. The PC spectra reveal both the evolution of a defect band located in the optically active layer as well as modifications of the interband part of the spectrum upon aging. Such changes represent sensitive quantitative measures of the aging status and provide insight into the microscopic changes of the device structure upon aging. (C) 1997 American Institute of Physics.

引用

页码：2233 / 2235

页数：3

共 9 条

[1]

Bell R.J., 1972, Introductory Fourier Transform Spectroscopy

[2] A MODEL FOR GRIN-SCH-SQW DIODE-LASERS [J].