Multifrequency signal analysis by Interpolated DFT method with maximum sidelobe decay windows

被引:132
作者
Belega, Daniel [2 ]
Dallet, Dominique [1 ]
机构
[1] Univ Bordeaux, ENSEIRB, CNRS, UMR 5218,IMS Lab, F-33405 Talence, France
[2] Politehn Univ Timisoara, Fac Elect & Telecommun, Dept Measurement & Opt Elect, Timisoara 300223, Romania
关键词
Interpolated DFT method; Maximum sidelobe decay windows; Multifrequency signal parameter estimation; Standard deviation estimation; FREQUENCY-DOMAIN; ALGORITHMS; ACCURACY;
D O I
10.1016/j.measurement.2008.08.006
中图分类号
T [工业技术];
学科分类号
120111 [工业工程];
摘要
in this paper, the estimation of a multifrequency signal parameters by the Interpolated Discrete Fourier Transform (IpDFT) method with maximum sidelobe decay windows is investigated. First, the theoretical expressions of ones of the most important parameters of a H-term maximum sidelobe decay window (H >= 2) are derived. In the following, the analytical formulas for estimating the parameters of a multifrequency signal are derived. The influence of a white Gaussian noise on parameter estimations is analyzed. Accurate formulas for estimating the standard deviations of these parameter estimations are also given, which are corroborated by means of computer simulations. Most of the derived formulas are more simples than the ones given in the scientific literature. (C) 2008 Elsevier Ltd. All rights reserved.
引用
收藏
页码:420 / 426
页数:7
相关论文
共 15 条
[1]
WINDOWS AND INTERPOLATION ALGORITHMS TO IMPROVE ELECTRICAL MEASUREMENT ACCURACY [J].
ANDRIA, G ;
SAVINO, M ;
TROTTA, A .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1989, 38 (04) :856-863
[2]
Belega D., 2005, Revue Roumaine des Sciences Techniques, Serie Electrotechnique et Energetique, V50, P349
[3]
Belega D, 2007, INT WORKSH INT DATA, P294
[4]
Choice of the cosine-class windows for ADC dynamic testing by spectral analysis [J].
Belega, Daniel ;
Ciugudean, Mircea ;
Stoiciu, Dan .
MEASUREMENT, 2007, 40 (04) :361-371
[5]
A/D CONVERTER PERFORMANCE ANALYSIS BY A FREQUENCY-DOMAIN APPROACH [J].
BENETAZZO, L ;
NARDUZZI, C ;
OFFELLI, C ;
PETRI, D .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1992, 41 (06) :834-839
[6]
COSNITA C, 1972, PROBLEMS ALGEBRA, P401
[8]
HARRIS FJ, 1978, P IEEE, V66, P51, DOI 10.1109/PROC.1978.10837
[9]
HIGH-ACCURACY ANALOG MEASUREMENTS VIA INTERPOLATED FFT [J].
JAIN, VK ;
COLLINS, WL ;
DAVIS, DC .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1979, 28 (02) :113-122
[10]
Marple Jr S. L., 1987, Digital Spectral Analysis With Applications