Resonant ultrasound spectroscopy (RUS) is an accurate measurement method in which the full stiffness tensor of a material is assessed from the free resonant frequencies of a small sample, and the viscoelastic damping is measured from the resonant peaks width. High viscoelastic damping causes the resonant peaks to overlap and therefore complicate the measurement of the resonant frequencies and the inverse identification of material properties. For that reason, RUS has been known to be fully applicable only to low damping materials. The purpose of this work is to adapt RUS for the characterization of highly attenuating viscoelastic materials. Spectrum measurement using shear transducers combined with dedicated signal processing is employed to retrieve the resonant frequencies despite overlapping. A probabilistic (Bayesian) formulation of the inverse problem, tackling the problem of correctly pairing the measured and predicted frequencies, is proposed. Applications to polymethylmethacrylate (isotropic) and glass/epoxy transversely isotropic samples are presented. The full set of viscoelastic properties is obtained with good repeatability. Particularly, elastic moduli of the isotropic samples are obtained within 1%. (C) 2014 Acoustical Society of America.
机构:
Univ Paris 06, UMR 7623, Lab Imagerie Parametr, F-75006 Paris, France
CNRS, UMR 7623, Lab Imagerie Parametr, F-75006 Paris, FranceUniv Paris 06, UMR 7623, Lab Imagerie Parametr, F-75006 Paris, France
机构:
UPMC Univ Paris 06, UMR 7623, Lab Imagerie Parametr, F-75005 Paris, France
CNRS, UMR 7623, Lab Imagerie Parametr, F-75005 Paris, FranceUPMC Univ Paris 06, UMR 7623, Lab Imagerie Parametr, F-75005 Paris, France
Granke, Mathilde
;
Grimal, Quentin
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UPMC Univ Paris 06, UMR 7623, Lab Imagerie Parametr, F-75005 Paris, France
CNRS, UMR 7623, Lab Imagerie Parametr, F-75005 Paris, FranceUPMC Univ Paris 06, UMR 7623, Lab Imagerie Parametr, F-75005 Paris, France
Grimal, Quentin
;
Saied, Amena
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UPMC Univ Paris 06, UMR 7623, Lab Imagerie Parametr, F-75005 Paris, France
CNRS, UMR 7623, Lab Imagerie Parametr, F-75005 Paris, FranceUPMC Univ Paris 06, UMR 7623, Lab Imagerie Parametr, F-75005 Paris, France
Saied, Amena
;
Nauleau, Pierre
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UPMC Univ Paris 06, UMR 7623, Lab Imagerie Parametr, F-75005 Paris, France
CNRS, UMR 7623, Lab Imagerie Parametr, F-75005 Paris, FranceUPMC Univ Paris 06, UMR 7623, Lab Imagerie Parametr, F-75005 Paris, France
Nauleau, Pierre
;
Peyrin, Francoise
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机构:
Univ Lyon, INSA Lyon, CNRS 5220, CREATIS INSERM U1044, F-69621 Villeurbanne, France
ESRF, F-38043 Grenoble, FranceUPMC Univ Paris 06, UMR 7623, Lab Imagerie Parametr, F-75005 Paris, France
机构:
Univ Calif Los Angeles, Inst Geophys & Planetary Phys, Los Angeles, CA 90024 USAUniv Calif Los Angeles, Inst Geophys & Planetary Phys, Los Angeles, CA 90024 USA
Isaak, DG
;
Ohno, I
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机构:Univ Calif Los Angeles, Inst Geophys & Planetary Phys, Los Angeles, CA 90024 USA
机构:
Univ Paris 06, UMR 7623, Lab Imagerie Parametr, F-75006 Paris, France
CNRS, UMR 7623, Lab Imagerie Parametr, F-75006 Paris, FranceUniv Paris 06, UMR 7623, Lab Imagerie Parametr, F-75006 Paris, France
机构:
UPMC Univ Paris 06, UMR 7623, Lab Imagerie Parametr, F-75005 Paris, France
CNRS, UMR 7623, Lab Imagerie Parametr, F-75005 Paris, FranceUPMC Univ Paris 06, UMR 7623, Lab Imagerie Parametr, F-75005 Paris, France
Granke, Mathilde
;
Grimal, Quentin
论文数: 0引用数: 0
h-index: 0
机构:
UPMC Univ Paris 06, UMR 7623, Lab Imagerie Parametr, F-75005 Paris, France
CNRS, UMR 7623, Lab Imagerie Parametr, F-75005 Paris, FranceUPMC Univ Paris 06, UMR 7623, Lab Imagerie Parametr, F-75005 Paris, France
Grimal, Quentin
;
Saied, Amena
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h-index: 0
机构:
UPMC Univ Paris 06, UMR 7623, Lab Imagerie Parametr, F-75005 Paris, France
CNRS, UMR 7623, Lab Imagerie Parametr, F-75005 Paris, FranceUPMC Univ Paris 06, UMR 7623, Lab Imagerie Parametr, F-75005 Paris, France
Saied, Amena
;
Nauleau, Pierre
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h-index: 0
机构:
UPMC Univ Paris 06, UMR 7623, Lab Imagerie Parametr, F-75005 Paris, France
CNRS, UMR 7623, Lab Imagerie Parametr, F-75005 Paris, FranceUPMC Univ Paris 06, UMR 7623, Lab Imagerie Parametr, F-75005 Paris, France
Nauleau, Pierre
;
Peyrin, Francoise
论文数: 0引用数: 0
h-index: 0
机构:
Univ Lyon, INSA Lyon, CNRS 5220, CREATIS INSERM U1044, F-69621 Villeurbanne, France
ESRF, F-38043 Grenoble, FranceUPMC Univ Paris 06, UMR 7623, Lab Imagerie Parametr, F-75005 Paris, France
机构:
Univ Calif Los Angeles, Inst Geophys & Planetary Phys, Los Angeles, CA 90024 USAUniv Calif Los Angeles, Inst Geophys & Planetary Phys, Los Angeles, CA 90024 USA
Isaak, DG
;
Ohno, I
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h-index: 0
机构:Univ Calif Los Angeles, Inst Geophys & Planetary Phys, Los Angeles, CA 90024 USA