Thermal effects on domain orientation of tetragonal piezoelectrics studied by in situ x-ray diffraction

被引：22

作者：

Chang, W ^{[1
]}

King, AH ^{[1
]}

Bowman, KJ ^{[1
]}

机构：

[1] Purdue Univ, W Lafayette, IN 47907 USA

来源：

APPLIED PHYSICS LETTERS | 2006年 / 88卷 / 24期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1063/1.2213952

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Thermal effects on domain orientation in tetragonal lead zirconate titanate (PZT) and lead titanate (PT) have been investigated by using in situ x-ray diffraction with an area detector. In the case of a soft PZT, it is found that the texture parameter called multiples of a random distribution (MRD) initially increases with temperature up to approximately 100 degrees C and then falls to unity at temperatures approaching the Curie temperature, whereas the MRD of hard PZT and PT initially undergoes a smaller increase or no change. The relationship between the mechanical strain energy and domain wall mobility with temperature is discussed. (c) 2006 American Institute of Physics.

引用

页数：3

共 10 条

[1] THERMAL EXPANSION AND PYROELECTRICITY IN LEAD TITANATE ZIRCONATE AND BARIUM TITANATE [J].