A new model for neutron reflectometry of adsorbed surfactant aggregates

被引:17
作者
Schulz, JC
Warr, GG [1 ]
Hamilton, WA
Butler, PD
机构
[1] Univ Sydney, Sch Chem, Sydney, NSW 2006, Australia
[2] Oak Ridge Natl Lab, Div Solid State, Oak Ridge, TN 37831 USA
[3] Natl Inst Stand & Technol, Ctr Neutron Res, Gaithersburg, MD 20899 USA
关键词
D O I
10.1021/jp990827j
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
A new interpretation of neutron reflectivity data for surfactants adsorbed on hydrophilic solid surfaces has been developed. Motivated by recent atomic force microscopy results, a model of the adsorbed layer is constructed based upon an adsorbed layer consisting of discrete, micelle-like surfactant aggregates of well-defined geometries. Scattering length density profiles and reflectivity curves are calculated for conventional, laterally unstructured adsorbed layers (a bilayer), as well as for cylindrical and spherical surfactant aggregates adsorbed on a hydrophilic surface. It is shown that treating such structured surfactant films as bilayers often results in a good fit to neutron reflectivity data, but that fit parameters lead one to underestimate the film thickness and overestimate the fractional surface coverage by the adsorbed film.
引用
收藏
页码:11057 / 11063
页数:7
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