Electrical properties of short DNA oligomers characterized by conducting atomic force microscopy

被引:55
作者
Nogues, C [1 ]
Cohen, SR [1 ]
Daube, SS [1 ]
Naaman, R [1 ]
机构
[1] Weizmann Inst Sci, Dept Chem Phys, IL-76100 Rehovot, Israel
关键词
D O I
10.1039/b410862k
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Complementary, single-strands of DNA (ssDNA), one bound to a gold electrode and the other to a gold nanoparticle were hybridized on the surface to form a self-assembled, dsDNA bridge between the two gold contacts. The adsorption of a ssDNA monolayer at each gold interface eliminates non-specific interactions of the dsDNA with the surface, allowing bridge formation only upon hybridization. The technique used, in addition to providing a good electrical contact, offers topographical contrast between the gold nanoparticles and the non-hybridized surface and enables accurate location of the bridge for the electrical measurements. Reproducible AFM conductivity measurements have been performed and significant qualitative differences were detected between conductivity in single- and double-strand DNA. The ssDNA was found to be insulating over a 4 eV range between +/- 2 V under the studied conditions, while the dsDNA, bound to the gold nanoparticle, behaves like a wide band gap semiconductor and passes significant current outside of a 3 eV gap.
引用
收藏
页码:4459 / 4466
页数:8
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