Growth of Ca2Si layers on Mg2Si/Si(111) substrates

被引:37
作者
Matsui, H [1 ]
Kuramoto, M [1 ]
Ono, T [1 ]
Nose, Y [1 ]
Tatsuoka, H [1 ]
Kuwabara, H [1 ]
机构
[1] Shizuoka Univ, Fac Engn, Hamamatsu, Shizuoka 4328561, Japan
关键词
diffusion; interfaces; surface processes; semiconducting silicon compounds;
D O I
10.1016/S0022-0248(01)02276-X
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Single phase Ca2Si layers are successfully grown on Mg2Si/Si substrates for the first time. These Mg2Si and Ca2Si layers are formed by heat treatment of Si and Mg2Si/Si substrates in Mg and Ca vapor, respectively. The replacement of Ca atoms with Mg in Mg2Si leads to the formation of single phase Ca,Si layers. it is confirmed that the formation of other silicide phases is suppressed, when the layers are grown under optimum growth time. The structural property of the resultant layers is examined by X-ray diffraction technique, scanning electron microscopy and transmission electron microscopy. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:2121 / 2124
页数:4
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