X-ray diffraction-line broadening analysis: Paracrystalline method

被引：65

作者：

Somashekar, R ^{[1
]}

Somashekarappa, H ^{[1
]}

机构：

[1] YUVARAJA COLL,DEPT PHYS,MYSORE 570006,KARNATAKA,INDIA

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1997年 / 30卷

关键词：

D O I：

10.1107/S0021889896010023

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Line-profile simulation and matching on the basis of a paracrystalline one-dimensional Hosemann model provides a promising approach to the analysis of line broadening. Results of analysis using X-ray wide-angle data of polymers and metallic samples are compared with Warren-Averbach multiple-order and single-order methods. Various column-length-distribution functions are also used for better agreement with the experimental profiles.

引用

页码：147 / 152

页数：6

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