Surface and physical characteristics of ZnO:Al nanostructured films

被引:27
作者
Fang, Te-Hua [1 ]
Kang, Shao-Hui [1 ]
机构
[1] Natl Formosa Univ, Inst Mech & Electromech Engn, Yunlin 632, Taiwan
关键词
OXIDE THIN-FILMS; DEPOSITION; GROWTH;
D O I
10.1063/1.3133217
中图分类号
O59 [应用物理学];
学科分类号
摘要
Structural and surface characterizations of the ZnO:Al nanostructured films were achieved by means of x-ray diffraction, scanning electron microscope, atomic force microscope, and nanoindentation measurements. The films exhibited hydrophobic behavior with contact angles of about 133.2 degrees-142.7 degrees S, and a decrease in the hardness and Young's modulus with decreasing indentation depths. Buckling behavior took place during the indentation process, and the fracture strength of the films was also investigated. The results show that the phase transformation from zinc blende to wurtzite structure. Also, it should be correlated with belongs to chairtype Peierls distortion with up to 38 degrees tilting (001) rock-salt structure along the ((1) over bar2 (1) over bar0) plane and followed tilting along the (10 (1) over bar0) plane by about 32 degrees for a fair match with (10 (1) over bar0) Zn. A nanogenerator with ZnO nanorods was then fabricated to define its piezoelectric characteristics. The power density per unit substrate area is about 18.3 mu W/mm(2). (C) 2009 American Institute of Physics. [DOI: 10.1063/1.3133217]
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页数:8
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