Spatially resolved characterization of superconducting films and cryoelectronic devices by means of low temperature scanning laser microscope

被引：33

作者：

Sivakov, AG

Zhuravel, AP

Turutanov, OG

Dmitrenko, IM

机构：

[1] B.I. Verkin Inst. Low Temp. Phys. E., Natl. Academy of Sciences of Ukraine, 310164 Kharkov

来源：

APPLIED SURFACE SCIENCE | 1996年 / 106卷

关键词：

D O I：

10.1016/S0169-4332(96)00445-X

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The work describes the low temperature scanning laser microscopy technique used for spatially resolved characterization of superconducting films and film-based cryoelectronic circuits in the temperature ranee from 2 to 300 K. The determination of superconducting parameters for separate elements of a high T-c Josephson junctions array and imaging of the resistive transition in a high T-c superconducting polycrystalline film are demonstrated. The spatial evolution of the resistive state of a Sn thin film strip associated with the phase slip lines formation is visualized.

引用

页码：390 / 395

页数：6