DC electric-field-induced DNA stretching for AFM and SNOM studies

被引:22
作者
Kim, JM
Ohtani, T
Park, JY
Chang, SM
Muramatsu, H
机构
[1] Seiko Instruments Inc, R&D Ctr, Matsudo, Chiba 2702222, Japan
[2] Natl Food Res Inst, Dept Food Engn, Tsukuba, Ibaraki 3058642, Japan
[3] Dong A Univ, Dept Chem Engn, Saha Gu, Pusan 604714, South Korea
基金
日本学术振兴会;
关键词
SNOM; NSOM; AFM; DNA;
D O I
10.1016/S0304-3991(02)00093-1
中图分类号
TH742 [显微镜];
学科分类号
摘要
An effective method of DNA stretching on mica surfaces is proposed for an extremely low concentration of DNA. The method is based on an electric field and well applied on the concentration range from 57 X 10(-3) to 57 x 10(-6) ng/ml. The stretching exists in a gap between positive and negative electrodes. The difference in the stretching efficiency among the different surfaces of bare mica, Mg2+ soaked mica and AP-mica is discussed. The best performance of the stretching is found from the surface of AP-mica for the same experimental condition of sample concentration and applied voltage. Finally, from a Scanning near-field optical microscope image, it is found that well-stretched DNA molecules have shown more similar optical resolution, which is inferred from an optical fiber probe, itself. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:139 / 149
页数:11
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